Chinese Journal of Lasers, Volume. 46, Issue 9, 904003(2019)

Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam

Gu Kan*, Hou Keliang, and Shen Jianqi
Author Affiliations
  • College of Science, University of Shanghai for Science and Technology, Shanghai 200093, China
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    References(13)

    [3] Shen T H[S.l.]. The cleaning of aluminum frame assembly units: UCRL-ID-14393 [S.l.]: Office of Scientific and Technical Information, 2001.

    [5] Cai X S, Su M X, Shen J Q et al[M]. Particle size measurement techniques and aplication(2010).

    [8] Gouesbet G, Gréhan G. Generalized Lorenz-Mie theories[M]. Berlin: Springer(2011).

    [11] Bohren C F, Huffman D R. Absorption and scattering of light by small particles[M]. Weinheim, Germany: Wiley-VCH Verlag GmbH(1998).

    [13] Bromwich T J. Electromagnetic waves[J]. The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 38, 143-164(1919).

    [14] Borgnis F E. Elektromagnetische eingenschwingungen dielektrischer räume[J]. Annalen Der Physik, 427, 359-384(1939).

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    Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 904003

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    Paper Information

    Category: Measurement and metrology

    Received: Mar. 25, 2019

    Accepted: --

    Published Online: Sep. 10, 2019

    The Author Email: Kan Gu (410926331@qq.com)

    DOI:10.3788/CJL201946.0904003

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