Chinese Journal of Lasers, Volume. 46, Issue 9, 904003(2019)
Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam
[3] Shen T H[S.l.]. The cleaning of aluminum frame assembly units: UCRL-ID-14393 [S.l.]: Office of Scientific and Technical Information, 2001.
[5] Cai X S, Su M X, Shen J Q et al[M]. Particle size measurement techniques and aplication(2010).
[8] Gouesbet G, Gréhan G. Generalized Lorenz-Mie theories[M]. Berlin: Springer(2011).
[11] Bohren C F, Huffman D R. Absorption and scattering of light by small particles[M]. Weinheim, Germany: Wiley-VCH Verlag GmbH(1998).
[13] Bromwich T J. Electromagnetic waves[J]. The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, 38, 143-164(1919).
[14] Borgnis F E. Elektromagnetische eingenschwingungen dielektrischer räume[J]. Annalen Der Physik, 427, 359-384(1939).
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Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 904003
Category: Measurement and metrology
Received: Mar. 25, 2019
Accepted: --
Published Online: Sep. 10, 2019
The Author Email: Kan Gu (410926331@qq.com)