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Chinese Journal of Lasers, Volume. 46, Issue 9, 904003(2019)

Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam

Gu Kan*, Hou Keliang, and Shen Jianqi
Author Affiliations
  • College of Science, University of Shanghai for Science and Technology, Shanghai 200093, China
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    Article index updated: Mar. 10, 2025

    The article is cited by 3 article(s) CLP online library. (Some content might be in Chinese.)
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    Gu Kan, Hou Keliang, Shen Jianqi. Measurement and Analysis on Backward Scattering of Microparticles Illuminated by Gaussian Beam[J]. Chinese Journal of Lasers, 2019, 46(9): 904003

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    Paper Information

    Category: Measurement and metrology

    Received: Mar. 25, 2019

    Accepted: --

    Published Online: Sep. 10, 2019

    The Author Email: Kan Gu (410926331@qq.com)

    DOI:10.3788/CJL201946.0904003

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology