Optoelectronic Technology, Volume. 43, Issue 1, 48(2023)
Research on the Influence and the Method Control of Cu/Ti Etchant Concentration during the Process of Metal Oxide Field‑effect Transistor
Fig. 1. Oxidation mechanism and wet etching mechanism of Cu/Ti alloy
Fig. 2. Variation trend of component concentration in Cu/Ti etchant without control
Fig. 4. Static test results of Cu etchant with copper ion concentration of 8 000 ppm
Fig. 5. The variation trend of product line width with copper ion concentration without control
Fig. 7. Concentration control curves of each component of Cu/Ti etchant with increasing copper ion concentration
Fig. 8. Variation trend of product line width and taper angle with copper ion concentration under concentration control
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Hui ZHAO. Research on the Influence and the Method Control of Cu/Ti Etchant Concentration during the Process of Metal Oxide Field‑effect Transistor[J]. Optoelectronic Technology, 2023, 43(1): 48
Category: Research and Trial-manufacture
Received: Dec. 26, 2022
Accepted: --
Published Online: Apr. 14, 2023
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