Optoelectronic Technology, Volume. 43, Issue 1, 48(2023)

Research on the Influence and the Method Control of Cu/Ti Etchant Concentration during the Process of Metal Oxide Field‑effect Transistor

Hui ZHAO
Author Affiliations
  • ——(Nanjing BOE Display Technology Co., Ltd., Nanjing 210033, CHN)
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    Figures & Tables(8)
    Oxidation mechanism and wet etching mechanism of Cu/Ti alloy
    Variation trend of component concentration in Cu/Ti etchant without control
    Etching process and formation of taper angle
    Static test results of Cu etchant with copper ion concentration of 8 000 ppm
    The variation trend of product line width with copper ion concentration without control
    Titanium residue in metal oxide products
    Concentration control curves of each component of Cu/Ti etchant with increasing copper ion concentration
    Variation trend of product line width and taper angle with copper ion concentration under concentration control
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    Hui ZHAO. Research on the Influence and the Method Control of Cu/Ti Etchant Concentration during the Process of Metal Oxide Field‑effect Transistor[J]. Optoelectronic Technology, 2023, 43(1): 48

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    Paper Information

    Category: Research and Trial-manufacture

    Received: Dec. 26, 2022

    Accepted: --

    Published Online: Apr. 14, 2023

    The Author Email:

    DOI:10.19453/j.cnki.1005-488x.2023.01.008

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