Acta Optica Sinica, Volume. 42, Issue 1, 0112001(2022)
Efficient and Reliable Thickness Measurement Method for Multilayer Coatings Based on Terahertz Time-Domain Spectroscopy Technology
Fig. 2. Schematic of multi-layer structure deriving equivalent reflection coefficient
Fig. 3. Comparison of ergodicity between standard Kent chaotic map and improved Kent chaotic map
Fig. 8. Schematic of multilayer samples. (a) Single-layer paper sheet fixed on the metallic substrate; (b) double-layer paper sheet fixed on the metallic substrate
Fig. 9. TBC. (a) Surface morphology of top coating; (b) structure diagram; (c) electron microscope image
Fig. 11. Comparison of fitness between adaptive TLBO algorithm, standard TLBO, and global search in Ref. [20]
Fig. 12. Comparison of measurement signal and simulation signal. (a) Sample 1; (b) sample 2
Fig. 13. Signal of TBC sample. (a) THz measurement signal of TBC; (b) comparison of measurement signal and simulation signal of TBC
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Binghua Cao, Dedong Zheng, Mengbao Fan, Fengshan Sun, Lin Liu. Efficient and Reliable Thickness Measurement Method for Multilayer Coatings Based on Terahertz Time-Domain Spectroscopy Technology[J]. Acta Optica Sinica, 2022, 42(1): 0112001
Category: Instrumentation, Measurement and Metrology
Received: Apr. 12, 2021
Accepted: Jul. 4, 2021
Published Online: Dec. 22, 2021
The Author Email: Binghua Cao (caobinghua@cumt.edu.cn)