Laser & Optoelectronics Progress, Volume. 57, Issue 9, 091201(2020)

Influence of Reflection-Induced Retardance on the Measurement of Fabry-Perot Etalon Interval

Jiayin Yu1, Jing Fan2, Xuhui Lan1, Xiaoyan Shen1、*, and Jing Yu1
Author Affiliations
  • 1College of Metrology & Measurement Engineering, China Jiliang University, Hangzhou, Zhejiang 310018, China;
  • 2Technical Monitoring Center of Changqing Oilfield Company, Xi'an, Shaanxi 710021, China
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    References(14)

    [3] Meng Q H, Chen S H, Lai J J et al. Multi-physics simulation and fabrication of a compact 128×128 micro-electro-mechanical system Fabry-Perot cavity tunable filter array for infrared hyperspectral imager[J]. Applied Optics, 54, 6850-6856(2015).

    [6] Born M, Wolf E[M]. Principles of optics, 338-369(1980).

    [8] Liu S J, Chang Y, Xiao Z G et al. Accurate calculation of the spacing of F-P etalon under the multi-wavelength weighted regression[J]. Infrared and Laser Engineering, 40, 529-532(2011).

    [10] Zhu H N, Xiao Z G, Hou Y F, rotation angle: 201510217472.7[P] et al. -11-09(2016).

    [12] Shen W D, Liu X D, Huang B Q et al. Analysis on the tunable optical properties of MOEMS filter based on Fabry-Perot Cavity[J]. Optics Communications, 239, 153-160(2004).

    [13] Zhu H N[M]. Lecture on new concept basic physics experiment, 18-48(2013).

    [14] Shen X Y, Sun Z P, Hu J C et al. Method for measuring focal length of transmission objective lens based on F-P etalon[J]. Chinese Journal of Scientific Instrument, 39, 1-8(2018).

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    Jiayin Yu, Jing Fan, Xuhui Lan, Xiaoyan Shen, Jing Yu. Influence of Reflection-Induced Retardance on the Measurement of Fabry-Perot Etalon Interval[J]. Laser & Optoelectronics Progress, 2020, 57(9): 091201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 14, 2019

    Accepted: Sep. 16, 2019

    Published Online: May. 6, 2020

    The Author Email: Xiaoyan Shen (xyshen@cjlu.edu.cn)

    DOI:10.3788/LOP57.091201

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