Journal of Infrared and Millimeter Waves, Volume. 41, Issue 3, 589(2022)
Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation
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Jie WANG, Bing-Chong TAN, Xing-Zhu TAO, Cheng-Cheng XU, Tian-Ying CHANG, Hong-Liang CUI, Jin ZHANG. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. Journal of Infrared and Millimeter Waves, 2022, 41(3): 589
Category: Research Articles
Received: Apr. 17, 2021
Accepted: --
Published Online: Jul. 8, 2022
The Author Email: Jin ZHANG (zhangjin0109@jlu.edu.cn)