Journal of Infrared and Millimeter Waves, Volume. 41, Issue 3, 589(2022)

Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation

Jie WANG1, Bing-Chong TAN1, Xing-Zhu TAO1, Cheng-Cheng XU1, Tian-Ying CHANG1, Hong-Liang CUI1,2, and Jin ZHANG1、*
Author Affiliations
  • 1Jilin University,College of Instrumentation & Electrical Engineering,Changchun 130061,China
  • 2Chongqing Institute of Green and Intelligent Technology,Chinese Academy of Sciences,Chongqing 400714,China
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    References(21)

    [16] Hahn S L[M]. Hilbert transform in signal processing(1996).

    [17] YAO Tian-run, SUN Hong[M]. Advanced digital signal processing(2018).

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    Jie WANG, Bing-Chong TAN, Xing-Zhu TAO, Cheng-Cheng XU, Tian-Ying CHANG, Hong-Liang CUI, Jin ZHANG. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. Journal of Infrared and Millimeter Waves, 2022, 41(3): 589

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    Paper Information

    Category: Research Articles

    Received: Apr. 17, 2021

    Accepted: --

    Published Online: Jul. 8, 2022

    The Author Email: Jin ZHANG (zhangjin0109@jlu.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2022.03.010

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