Journal of Infrared and Millimeter Waves, Volume. 41, Issue 3, 589(2022)

Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation

Jie WANG1, Bing-Chong TAN1, Xing-Zhu TAO1, Cheng-Cheng XU1, Tian-Ying CHANG1, Hong-Liang CUI1,2, and Jin ZHANG1、*
Author Affiliations
  • 1Jilin University,College of Instrumentation & Electrical Engineering,Changchun 130061,China
  • 2Chongqing Institute of Green and Intelligent Technology,Chinese Academy of Sciences,Chongqing 400714,China
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    Figures & Tables(10)
    The schematic diagram of terahertz reflection time domain spectral system
    Glass fiber laminate with defects of different thickness
    Terahertz reflected time domain waveforms measured from the sample
    Terahertz reflected pulses between upper and lower surfaces of defect 1
    The thickness analysis results of defect 1:(a)Terahertz reflected pulses of defect 1,(b)MUSIC-HT,(c)AR-HT,(d)T-HT,(e)IFFT-HT
    The thickness analysis results of defect 2:(a)Terahertz reflected pulses of defect 2,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
    The thickness analysis results of defect 3:(a)Terahertz reflected pulses of defect 3,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
    The thickness analysis results of defect 4:(a)Terahertz reflected pulses of defect 4,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
    THz imaging results:(a)MUSIC-HT,(b)AR-HT
    • Table 1. The time delay differences of reflected pulses between upper and lower surfaces of defects and the thicknesses

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      Table 1. The time delay differences of reflected pulses between upper and lower surfaces of defects and the thicknesses

      缺陷No.缺陷一缺陷二缺陷三缺陷四
      实际厚度(mm)0.470.220.120.08
      MUSIC-HT时延差(ps)4.031.770.830.50
      计算厚度(mm)0.450.200.090.06
      测量误差(mm)0.020.020.030.02
      AR-HT时延差(ps)4.031.770.830.50
      计算厚度(mm)0.450.200.090.06
      测量误差(mm)0.020.020.030.02
      T-HT时延差(ps)3.531.77--
      计算厚度(mm)0.400.20--
      测量误差(mm)0.070.02--
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    Jie WANG, Bing-Chong TAN, Xing-Zhu TAO, Cheng-Cheng XU, Tian-Ying CHANG, Hong-Liang CUI, Jin ZHANG. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. Journal of Infrared and Millimeter Waves, 2022, 41(3): 589

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    Paper Information

    Category: Research Articles

    Received: Apr. 17, 2021

    Accepted: --

    Published Online: Jul. 8, 2022

    The Author Email: Jin ZHANG (zhangjin0109@jlu.edu.cn)

    DOI:10.11972/j.issn.1001-9014.2022.03.010

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