Journal of Infrared and Millimeter Waves, Volume. 41, Issue 3, 589(2022)
Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation
Fig. 1. The schematic diagram of terahertz reflection time domain spectral system
Fig. 3. Terahertz reflected time domain waveforms measured from the sample
Fig. 4. Terahertz reflected pulses between upper and lower surfaces of defect 1
Fig. 5. The thickness analysis results of defect 1:(a)Terahertz reflected pulses of defect 1,(b)MUSIC-HT,(c)AR-HT,(d)T-HT,(e)IFFT-HT
Fig. 6. The thickness analysis results of defect 2:(a)Terahertz reflected pulses of defect 2,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
Fig. 7. The thickness analysis results of defect 3:(a)Terahertz reflected pulses of defect 3,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
Fig. 8. The thickness analysis results of defect 4:(a)Terahertz reflected pulses of defect 4,(b)MUSIC-HT,(c)AR-HT,(d)T-HT
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Jie WANG, Bing-Chong TAN, Xing-Zhu TAO, Cheng-Cheng XU, Tian-Ying CHANG, Hong-Liang CUI, Jin ZHANG. Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation[J]. Journal of Infrared and Millimeter Waves, 2022, 41(3): 589
Category: Research Articles
Received: Apr. 17, 2021
Accepted: --
Published Online: Jul. 8, 2022
The Author Email: Jin ZHANG (zhangjin0109@jlu.edu.cn)