Acta Optica Sinica, Volume. 43, Issue 10, 1034001(2023)
X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern
Fig. 3. Test samples and detected speckle fields. (a)(e) 10-hole sample; (b)(f) circuit sample; (c)(g) 10-hole defected sample; (d)(h) circuit defected sample
Fig. 4. Angle matching diagram of the rotation angle of the standard image and the correlation coefficient
Fig. 5. Defected speckle fields under different signal-to-noise ratios. (a)
Fig. 6. the variation of correlation coefficient
Fig. 7. Detail enhancement results. (a) High-pass filtering result; (b) Wiener filtering result; (c) guided filtering result; (d) the cross-section of various filtering results, standard speckle, and test speckle in Fig.3(g), when
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Hairui Yang, Zhijie Tan, Hong Yu, Xuejuan Pan, Shensheng Han. X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern[J]. Acta Optica Sinica, 2023, 43(10): 1034001
Category: X-Ray Optics
Received: Nov. 9, 2022
Accepted: Jan. 3, 2023
Published Online: Apr. 25, 2023
The Author Email: Yu Hong (yuhong@siom.ac.cn)