Researching | X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern

Acta Optica Sinica, Volume. 43, Issue 10, 1034001(2023)

X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern

Hairui Yang^1,2,3, Zhijie Tan¹, Hong Yu^1,3、*, Xuejuan Pan¹, and Shensheng Han^1,3

Author Affiliations

¹Key Laboratory for Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

²University of Chinese Academy of Sciences, Beijing 100049, China

³Hangzhou Institute for Advanced Study, University of Chinese Academy of Sciences, Hangzhou 310024, Zhejiang, China

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Hairui Yang, Zhijie Tan, Hong Yu, Xuejuan Pan, Shensheng Han. X-Ray Intensity Correlation Defect Detection Using a Single Speckle Pattern[J]. Acta Optica Sinica, 2023, 43(10): 1034001

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Paper Information

Category: X-Ray Optics

Received: Nov. 9, 2022

Accepted: Jan. 3, 2023

Published Online: Apr. 25, 2023

The Author Email: Yu Hong (yuhong@siom.ac.cn)

DOI:10.3788/AOS221961

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology