Microelectronics, Volume. 51, Issue 2, 221(2021)
An Easily Blowing and Highly Reliable Silicided Polysilicon Fuse Trimming Circuit
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ZHANG Lin, LI Jing, FU Dongbing, WAN Xianjie, DING Yi. An Easily Blowing and Highly Reliable Silicided Polysilicon Fuse Trimming Circuit[J]. Microelectronics, 2021, 51(2): 221
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Received: Aug. 3, 2020
Accepted: --
Published Online: Mar. 11, 2022
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