Chinese Optics, Volume. 18, Issue 1, 42(2025)

Structured light surface shape measurement method for highly reflective surfaces

Yun WANG1, Jian-ying GUO1, Jun-zhe LIANG2, Feng ZHU1, Guang-xi CHEN1, Mao-dong REN3, and Jin LIANG1、*
Author Affiliations
  • 1State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
  • 2School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049,China
  • 3Innovation Lab, XTOP 3D Technology (Shenzhen) Co. Ltd., Shenzhen 518060, China
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    References(22)

    [8] ZHU ZH M, ZHU W T, ZHOU F Q et al. Three-dimensional measurement of fringe projection based on the camera response function of the polarization system[J]. Optical Engineering, 60, 055105(2021).

    [11] LI SH X, DA F P, RAO L. Adaptive fringe projection technique for high-dynamic range three-dimensional shape measurement using binary search[J]. Optical Engineering, 56, 094111(2017).

    [12] FENG J Y, CHEN H Y, SHI CH. Three-dimensional measurement of highly-reflective surface using structured light technique[J]. Laser & Optoelectronics Progress, 56, 221202(2019).

    [14] [14] Wuxi Tuchuang Intelligent Technology Co., Ltd. Exposure value ion method f measuring threedimensional structured light on surfaces with different reflectivity: CN, 202111658669.6[P]. 20211230. (in Chinese).

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    Yun WANG, Jian-ying GUO, Jun-zhe LIANG, Feng ZHU, Guang-xi CHEN, Mao-dong REN, Jin LIANG. Structured light surface shape measurement method for highly reflective surfaces[J]. Chinese Optics, 2025, 18(1): 42

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    Paper Information

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    Received: May. 10, 2024

    Accepted: Sep. 3, 2024

    Published Online: Mar. 14, 2025

    The Author Email:

    DOI:10.37188/CO.2024-0087

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