Chinese Optics, Volume. 18, Issue 1, 42(2025)

Structured light surface shape measurement method for highly reflective surfaces

Yun WANG1, Jian-ying GUO1, Jun-zhe LIANG2, Feng ZHU1, Guang-xi CHEN1, Mao-dong REN3, and Jin LIANG1、*
Author Affiliations
  • 1State Key Laboratory for Manufacturing Systems Engineering, School of Mechanical Engineering, Xi’an Jiaotong University, Xi’an 710049, China
  • 2School of Microelectronics, Xi’an Jiaotong University, Xi’an 710049,China
  • 3Innovation Lab, XTOP 3D Technology (Shenzhen) Co. Ltd., Shenzhen 518060, China
  • show less

    The complex reflective properties of highly reflective surfaces bring overexposure and underexposure problems to surface structured light technology. In order to reconstruct the measured surface completely and accurately, a multiple exposure method is proposed in this paper. The proposed method can predict the exposure time according to the reflective intensity of the measured surface. Firstly, the camera response curve of the imaging system is obtained by projecting a series of uniform gray images at different exposure times, and the irradiance image that can reflect the reflection intensity of the measured surface is calculated. Then, the fuzzy C-means clustering method is used to adaptively segment different irradiance regions of the target and obtain the central irradiance of each region. The optimal exposure time is predicted for different reflection regions based on the camera response curve. Finally, the 3D reconstruction of the highly reflective surface is realized by combining the multiple exposure fusion algorithm. The experimental results show that the proposed method can simultaneously reconstruct the strongly reflective area and the excessively dark area of the aluminum alloy surface, with a reconstruction error of less than 0.5 mm, the maximum deviation reduced by 74.78%, and the standard deviation reduced by 48.96%. The proposed method can correctly predict the exposure time according to regional reflection characteristics, effectively overcome the problems of phase loss and phase distortion caused by regional overexposure and regional darkness, and completely and accurately reconstruct different reflection regions of highly reflective surfaces.

    Keywords
    Tools

    Get Citation

    Copy Citation Text

    Yun WANG, Jian-ying GUO, Jun-zhe LIANG, Feng ZHU, Guang-xi CHEN, Mao-dong REN, Jin LIANG. Structured light surface shape measurement method for highly reflective surfaces[J]. Chinese Optics, 2025, 18(1): 42

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: May. 10, 2024

    Accepted: Sep. 3, 2024

    Published Online: Mar. 14, 2025

    The Author Email:

    DOI:10.37188/CO.2024-0087

    Topics