Laser & Optoelectronics Progress, Volume. 62, Issue 5, 0504001(2025)
An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors
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Yanming Zhang, Xinrong Wen, Wenlong Fan, Chun Xu. An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors[J]. Laser & Optoelectronics Progress, 2025, 62(5): 0504001
Category: Detectors
Received: May. 20, 2024
Accepted: Jul. 29, 2024
Published Online: Mar. 10, 2025
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