Laser & Optoelectronics Progress, Volume. 62, Issue 5, 0504001(2025)

An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors

Yanming Zhang1,2、*, Xinrong Wen2, Wenlong Fan3, and Chun Xu2
Author Affiliations
  • 1College of Metrology Measurement and Instrument, China Jiliang University, Hangzhou 310018, Zhejiang , China
  • 2Shanghai Astronomical Observatory, Chinese Academy of Sciences, Shanghai 200030, China
  • 3Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    [5] Zhu H Y, Ji P, Zeng Z J et al. Multi-channel infrared medium long wave chip and dual lens integrated components packaging technology[J]. Acta Optica Sinica, 44, 1828002(2024).

    [6] Qiao H. Study on the fabrication and dark current characteristics of spaceborne mercury cadmium telluride infrared photodetectors[D](2016).

    [7] Zhu H Y, Chen J L, Zeng Z J et al. Stray light analysis of long-wave infrared refrigeration dewar components[J]. Chinese Journal of Lasers, 51, 0810005(2024).

    [8] Wang L, Xu C B. The method of dark currents measurement in infrared long wave HgCdTe detector[J]. Laser & Infrared, 50, 563-566(2020).

    [10] Cao D H. Planck’s radiation law and its application[J]. Infrared Technology, 15, 45-48(1993).

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    Yanming Zhang, Xinrong Wen, Wenlong Fan, Chun Xu. An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors[J]. Laser & Optoelectronics Progress, 2025, 62(5): 0504001

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    Paper Information

    Category: Detectors

    Received: May. 20, 2024

    Accepted: Jul. 29, 2024

    Published Online: Mar. 10, 2025

    The Author Email:

    DOI:10.3788/LOP241323

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