An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors

Yanming Zhang; Xinrong Wen; Wenlong Fan; Chun Xu

doi:10.3788/LOP241323

Laser & Optoelectronics Progress, Volume. 62, Issue 5, 0504001(2025)

An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors

Yanming Zhang^1,2、*, Xinrong Wen², Wenlong Fan³, and Chun Xu²

Author Affiliations

¹College of Metrology Measurement and Instrument, China Jiliang University, Hangzhou 310018, Zhejiang , China

²Shanghai Astronomical Observatory, Chinese Academy of Sciences, Shanghai 200030, China

³Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

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Figures & Tables(20)

Fig. 1. Schematic of detector assembly structure

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Fig. 2. Schematic of temperature control assembly

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Fig. 3. Detector response at ambient temperature of 285.5 K

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Fig. 4. Detector response at ambient temperature of 299.0 K

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Fig. 5. Multiple groups R_blackbody(T₁) and S₁ fit straight lines at 285.5 K, longitudinal axis intercept is S₂

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Fig. 6. Multiple groups R_blackbody(T₁) and S₁ fit straight lines at 299.0 K, longitudinal axis intercept is S₂

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Fig. 7. Multiple groups S₂ and R(T₂) fit straight line, longitudinal axis intercept is I_dark

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Fig. 8. Histogram of pixel dark current horizontal distribution

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Fig. 9. Dark current image measured with blackbody method

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Fig. 10. Platinum resistance temperature monitored at reflector mirror

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Fig. 11. Response curves of the pixel at different window temperatures

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Fig. 12. Dark current level of the pixel

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Fig. 13. Histogram of pixel dark current horizontal distribution

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Fig. 14. Dark current image measured with improved method

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Table 1. Parameters for Eq.(4) calculations
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Table 1. Parameters for Eq.(4) calculations
S₁（285.5 K） /（e^-·s^-1） S₁（299.0 K） /（e^-·s^-1） R_blackbody（T₁） /（photon·s^-1）
75.14 81.29 672.94 （303.2 K）
130.17 151.93 3719.35 （323.2 K）
317.54 346.90 11754.09 （338.2 K）

Table 2. Parameters for Eq. (5) calculations
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Table 2. Parameters for Eq. (5) calculations
S₂ /（e^-·s^-1） R（T₂） /（photon·s^-1）
24.11 （285.5 K） 121.61 （285.5 K）
28.09 （299.0 K） 456.61 （299.0 K）

Table 3. Dark current measured with blackbody method
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Table 3. Dark current measured with blackbody method
Item Dark current /（e^-·s^-1）
Mean 27.05
Median 27.01

Table 4. Parameters for Eq(7) calculations

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Table 4. Parameters for Eq(7) calculations

S₃ /（e^-·s^-1）	R（T） /（photon·s^-1）
24.00 （279.9 K）	68.05 （279.9 K）
23.42 （275.2 K）	40.65 （275.2 K）
21.26 （272.7 K）	30.77 （272.7 K）
19.87 （268.2 K）	18.41 （268.2 K）
18.34 （263.4 K）	10.50 （263.4 K）

Table 5. Dark current measured with improved method
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Table 5. Dark current measured with improved method
Item Dark current /（e^-·s^-1）
Mean 16.95
Median 16.93

Table 6. Comparison of dark currents measured by two methods
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Table 6. Comparison of dark currents measured by two methods
Method Dark current /（e^-·s^-1）
Blackbody method 27.05
Improved method 16.95

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Yanming Zhang, Xinrong Wen, Wenlong Fan, Chun Xu. An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors[J]. Laser & Optoelectronics Progress, 2025, 62(5): 0504001

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