Laser & Optoelectronics Progress, Volume. 62, Issue 5, 0504001(2025)

An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors

Yanming Zhang1,2、*, Xinrong Wen2, Wenlong Fan3, and Chun Xu2
Author Affiliations
  • 1College of Metrology Measurement and Instrument, China Jiliang University, Hangzhou 310018, Zhejiang , China
  • 2Shanghai Astronomical Observatory, Chinese Academy of Sciences, Shanghai 200030, China
  • 3Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
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    Astronomical focal-plane infrared detectors are generally installed in cryogenic Dewars. To measure the detector's dark current, all infrared backgrounds must be shielded. Hence, excluding radiations from the Dewar windows without modifying the Dewar structure is challenging. Herein, we introduce a revised method to measure the dark current by modifying the temperature of the Dewar window without disassembling and assembling the Dewar. Test results of a 512×640 near-infrared focal-plane detector show that the revised method can obtain dark currents that are 10 e-/s lower than those afforded by conventional methods without excluding the infrared background from the Dewar windows. The associated revised test procedure can be used to promptly evaluate the dark-current performance of the detector.

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    Yanming Zhang, Xinrong Wen, Wenlong Fan, Chun Xu. An Improved Dark Current Testing Method for Encapsulated Dewar Infrared Detectors[J]. Laser & Optoelectronics Progress, 2025, 62(5): 0504001

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    Paper Information

    Category: Detectors

    Received: May. 20, 2024

    Accepted: Jul. 29, 2024

    Published Online: Mar. 10, 2025

    The Author Email:

    DOI:10.3788/LOP241323

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