Laser & Optoelectronics Progress, Volume. 61, Issue 14, 1409001(2024)

Particle Characterization and Classification Device Based on Digital in-Line Holography

Wenxuan Zhang, Jinying Zhang, and Jingwen Li*
Author Affiliations
  • School of Science, Jiangnan University, Wuxi 214122, Jiangsu , China
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    References(23)

    [3] Pucer J F. The correction of TEOM PM10 measurements at different monitoring sites and climates[J]. SN Applied Sciences, 1, 1235(2019).

    [18] Bohren C F, Huffman D R[M]. Absorption and scattering of light by small particles(2008).

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    Wenxuan Zhang, Jinying Zhang, Jingwen Li. Particle Characterization and Classification Device Based on Digital in-Line Holography[J]. Laser & Optoelectronics Progress, 2024, 61(14): 1409001

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    Paper Information

    Category: Holography

    Received: Dec. 4, 2023

    Accepted: Jan. 10, 2024

    Published Online: Jul. 17, 2024

    The Author Email: Jingwen Li (jingwenli@jiangnan.edu.cn)

    DOI:10.3788/LOP232616

    CSTR:32186.14.LOP232616

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