Laser & Optoelectronics Progress, Volume. 61, Issue 14, 1409001(2024)

Particle Characterization and Classification Device Based on Digital in-Line Holography

Wenxuan Zhang, Jinying Zhang, and Jingwen Li*
Author Affiliations
  • School of Science, Jiangnan University, Wuxi 214122, Jiangsu , China
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    Figures & Tables(8)
    Digital holographic microscopy test platform based on inertial impact sampling. (a) Schematic of the platform with inertial impactor; (b) illustration of the prototype design; (c) experimental prototype
    Schematic of in-line holography
    Schematic diagrams of inertial impact sampling and inertial separation. (a) Illustration of the particle release at t=0 s; (b) illustration of particle impaction on the deposition section over a short time period t=0.01 s; (c) the correlation between particle position, mass density and particle size on the sample plate
    Distribution maps of four types of particles with a diameter of 5 μm. (a) The deposition distribution of Silica, PMMA, PS, and PMSQ particles in the sampler; (b) histogram of the positions of Silica, PMMA, PS, and PMSQ particles in the sampler
    Illustration of particle refractive index measurement. (a)‒(c) Normalized holograms of 5 μm diameter Silica particles, numerical fitting of Lorenz-Mie theory and azimuth-mean radial profile, the blue scatter points in the radial profile are the experimental data, the blue solid line represents the angular average when fitting to Lorenz-Mie theory, the dashed red-green curves indicate the standard deviations of the average; (d)‒(f) (g)‒(i) (j)‒(l) fitting process and data of PMMA, PS, and PMSQ particles with a diameter of 5 μm; (m) the retrieved particle diameter and refractive index, the horizontal and vertical bars mark the deviation from the reference values provided by the manufacturer; (n) the histogram of particles with different refractive indices when the diameters are fixed to be 5 μm, all scales are 20 μm
    Illustration of particle refractive index measurement. (a)‒(c) Normalized holograms of 30 μm diameter Silica particles, numerical fitting of Lorenz-Mie theory and azimuth-mean radial profile; (d)‒(f) (g)‒(i) fitting process and data of PMMA, PS particles with a diameter of 5 μm, all scales are 20 μm
    Image of shaped particle and illustration of shaped particle refractive index measurement. (a)‒(d) Original image of 5 μm diameter ellipsoidal Silica particle, numerical fitting of Lorenz-Mie theory and azimuth-mean radial profile; (e)‒(h) original image, fitting process, and data of 5 μm nearly diamond shaped PS particles, all scales are 20 μm
    Two-dimensional scatter plots of mass density and refractive index of PS, PMMA, PMSQ, and Silica particles, as well as density and refractive index histograms of four particles
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    Wenxuan Zhang, Jinying Zhang, Jingwen Li. Particle Characterization and Classification Device Based on Digital in-Line Holography[J]. Laser & Optoelectronics Progress, 2024, 61(14): 1409001

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    Paper Information

    Category: Holography

    Received: Dec. 4, 2023

    Accepted: Jan. 10, 2024

    Published Online: Jul. 17, 2024

    The Author Email: Jingwen Li (jingwenli@jiangnan.edu.cn)

    DOI:10.3788/LOP232616

    CSTR:32186.14.LOP232616

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