Researching | X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction

Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1437004(2025)

X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction

Fuquan Qin and Yan Wei^*

Author Affiliations

College of Computer and Information Science, Chongqing Normal University, Chongqing 401331, China

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References(23)

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Fuquan Qin, Yan Wei. X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1437004

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Paper Information

Category: Digital Image Processing

Received: Feb. 28, 2025

Accepted: May. 6, 2025

Published Online: Jul. 16, 2025

The Author Email: Yan Wei (weiyancq@163.com)

DOI:10.3788/LOP250731

CSTR:32186.14.LOP250731

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology