Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1437004(2025)
X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction
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Fuquan Qin, Yan Wei. X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1437004
Category: Digital Image Processing
Received: Feb. 28, 2025
Accepted: May. 6, 2025
Published Online: Jul. 16, 2025
The Author Email: Yan Wei (weiyancq@163.com)
CSTR:32186.14.LOP250731