Laser & Optoelectronics Progress, Volume. 62, Issue 14, 1437004(2025)

X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction

Fuquan Qin and Yan Wei*
Author Affiliations
  • College of Computer and Information Science, Chongqing Normal University, Chongqing 401331, China
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    To address the missed detection of small prohibited items in X-ray security inspection images due to low pixel ratios and ambiguous features, this study proposes a detection algorithm based on fine-grained feature enhancement. First, we design a learnable spatial reorganization module that replaces traditional downsampling operations with dynamic pixel allocation strategies to reduce fine-grained feature loss. Second, we construct a dynamic basis vector multi-scale attention module that adaptively adjusts the number of basis vectors according to feature entropy, enabling cross-dimensional feature interaction. Finally, we introduce a 160×160 high-resolution detection head that reduces the minimum detectable target size from 8 pixel×8 pixel to 4 pixel×4 pixel. Experimental results demonstrate that on the SIXray, OPIXray, and PIDray datasets, our algorithm achieves mean Average Precision (mAP) values of 93.3%, 91.2%, and 86.9%, respectively, showing improvements of 1.2%?3.1% over the YOLOv8 baseline model while only increasing the parameter count by 0.2×106.

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    Fuquan Qin, Yan Wei. X-Ray Security Inspection Image Contraband Detection Algorithm for Enhancing Fine-Grained Feature Extraction[J]. Laser & Optoelectronics Progress, 2025, 62(14): 1437004

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    Paper Information

    Category: Digital Image Processing

    Received: Feb. 28, 2025

    Accepted: May. 6, 2025

    Published Online: Jul. 16, 2025

    The Author Email: Yan Wei (weiyancq@163.com)

    DOI:10.3788/LOP250731

    CSTR:32186.14.LOP250731

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