Experiment Science and Technology, Volume. 23, Issue 2, 54(2025)

Design Experiment of the Integrated Circuit Testing System Based on Operational Amplifiers

Xuan GOU, Min HUANG*, and Ke LIU
Author Affiliations
  • School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu 611731, China
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    References(2)

    [16] 科特尔 B, 曼西尼 R, 姚剑清[M]. 运算放大器权威指南(2010).

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    Xuan GOU, Min HUANG, Ke LIU. Design Experiment of the Integrated Circuit Testing System Based on Operational Amplifiers[J]. Experiment Science and Technology, 2025, 23(2): 54

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    Paper Information

    Category: Experimental Teaching and Teaching Experimental

    Received: Nov. 9, 2023

    Accepted: --

    Published Online: May. 9, 2025

    The Author Email: Min HUANG (黄敏)

    DOI:10.12179/1672-4550.20230530

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