[1] [1] Frandoli G, D'Acunzo M, Dan H, et al. Advanced screen printing: Application on microLED tiled display[J]. Journal of the Society for Information Display, 2022, 30(4): 263-270.

[2] [2] Wu M C, Chung M C, Wu C Y. 3 200 ppi matrix-addressable blue MicroLED display[J]. Micromachines, 2022, 13(8): 1350.

[3] [3] Li S, Song B, Peterson T, et al. MicroLED chromatic confocal microscope[J]. Optics Letters, 2021, 46(11): 2722-2725.

[4] [4] Ursutiu D, Jones B K. Low-frequency noise used as a lifetime test of LEDs[J]. Semiconductor Science and Technology, 1996, 11(8): 1133-1136.

[7] [7] Xue H, Shao Y, Yoon J, et al. Temperature-dependent low-frequency noise analysis of ZnO nanowire field-effect transistors[J]. IEEE Transactions on Electron Devices, 2021, 68(7): 3532-3536.

[8] [8] Jena P K, Das S, Bardhan S, et al. Low frequency noise analysis in AlGaN/GaN HEMTs[C]//2023 1st International Conference on Circuits, Power and Intelligent Systems (CCPIS). IEEE, 2023: 1-4.

[12] [12] Shah J M, Li Y, Gessmann T, et al. Experimental analysis and a new theoretical model for anomalously high ideality factors (n≫2.0) in GaN-based p-n junction diodes[J]. MRS Online Proceedings Library, 2003, 798(1): 689-694.

[13] [13] Meneghesso G, Levada S, Pierobon R, et al. Degradation mechanisms of GaN-based LEDs after accelerated DC current aging[C]//Digest. International Electron Devices Meeting. IEEE, 2002: 103-106.

[14] [14] Xu J, Zhang X, Yang H, et al. Enhancement of performance of GaN-based light-emitting diodes by insertion and optimization of n-InGaN/GaN composite current-spreading layers[J]. Japanese Journal of Applied Physics, 2014, 53(2): 022101.

[18] [18] Nafaa B, Cretu B, Ismail N, et al. Low-frequency noise measurements at liquid helium temperature operation in ultra-thin buried oxide transistors-physical interpretation of transport phenomena[J]. Solid-State Electronics, 2018, 150: 1-7.

[21] [21] Costa M, Goldberger A L, Peng C K. Multiscale entropy analysis of biological signals[J]. Physical Review E, Statistical, Nonlinear, and Soft Matter Physics, 2005, 71(2): 021906.