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Semiconductor Optoelectronics, Volume. 46, Issue 2, 226(2025)

Low-Frequency Noise Characterization of GaN-Based Micro-LED Chips

ZHANG Tengfei1, WANG Wei2, and HUA Wenyuan3
Author Affiliations
  • 1College of Electronic and Information Engineering, Nanjing University of Information Science and Technology, Nanjing 210044, CHN
  • 2Jiangsu Province Integrated Circuit Reliability Technology and Testing System Engineering Research Center, Wuxi University, Wuxi 214105, CHN
  • 3Jiangnan University, School of Integrated Circuits, Wuxi 214122, CHN
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    ZHANG Tengfei, WANG Wei, HUA Wenyuan. Low-Frequency Noise Characterization of GaN-Based Micro-LED Chips[J]. Semiconductor Optoelectronics, 2025, 46(2): 226

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    Paper Information

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    Received: Oct. 10, 2024

    Accepted: Sep. 18, 2025

    Published Online: Sep. 18, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.20241010001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology