[1] Jin W Q, Tao Y, Shi F et al. Progress of low level light video technology[J]. Infrared and Laser Engineering, 44, 3167-3176(2015).

[2] Wang S L, Sun A P, Li X N et al. Research progress of an electron bombarded active pixel sensor[J]. Infrared Technology, 46, 1120-1129(2024).

[3] Han J, Jiao G C, Yan L et al. Research progress of digital low-light-level devices[J]. Journal of Applied Optics, 44, 874-886(2023).

[4] Li B Z, Liu X, Zhao Z X et al. Self-supervised two-stage denoising algorithm based on blind-spot network for EBAPS images[J]. Acta Optica Sinica, 44, 2210001(2024).

[5] Dabov K, Foi A, Katkovnik V et al. Image denoising by sparse 3-D transform-domain collaborative filtering[J]. IEEE Transactions on Image Processing, 16, 2080-2095(2007).

[6] Zhang K, Zuo W M, Chen Y J et al. Beyond a Gaussian denoiser: residual learning of deep CNN for image denoising[J]. IEEE Transactions on Image Processing, 26, 3142-3155(2017).

[7] Tu Y G. Research on video signal processing technology for individual night vision glasses[D], 27-39(2019).

[8] Xia H T, Qian Y S, Wang Y L et al. Mixed noise removal algorithm of EBAPS image under low illumination condition based on FPGA[J]. Journal of Applied Optics, 43, 1075-1087(2022).

[9] Cao Y, Zhu X P, Zhang X M et al. Noise image processing algorithm for a low-light EBCMOS acquisition system based on FPGA[J]. Acta Photonica Sinica, 53, 1110002(2024).

[10] Liu X, Li R Q, Jin W Q et al. Total variational noise reduction method for EBAPS image based on weighted nuclear norm minimization[J]. Optics Express, 33, 1932-1951(2025).

[11] Tang X D. Research on EBAPS electron bombardment performance test technology[D], 7-9(2019).

[12] Bai J Z, Bai Y L, Hou X et al. The analysis of electron scattering among multiplying layer in EBAPS using optimized Monte Carlo method[J]. Modern Physics Letters B, 34, 2050398(2020).

[13] Song Y Y, Song D, Li Y et al. Influence of passivation layer and P-type base structure optimization on charge collection efficiency of electron bombardment active pixel sensor[J]. Chinese Journal of Lasers, 50, 1803001(2023).

[14] Liu X, Li B Z, Li L et al. Adaptive wavelet threshold denoising based on pixel dark noise of EBAPS[J]. Acta Optica Sinica, 44, 1610001(2024).

[15] Liu F G, Su T N, Liu B H et al. Flicker noise testing based on a discrete coefficient and Harris corner point detection for a low-light image intensifier[J]. Infrared Technology, 46, 1154-1161(2024).

[16] Luo Z H, Cheng S, Qian Y S et al. Flicker noise testing system of electron bombarded active pixel sensor[J]. Infrared Technology, 46, 1130-1137(2024).

[17] Lü M, Song D, Jiao G C et al. Characterization of backscattered electrons in EBCMOS[J]. Chinese Journal of Lasers, 51, 1703001(2024).

[18] Li T T, Xiao C, Jiao G C et al. Research on noise characteristics of EBAPS digital low light level device[J]. Proceedings of SPIE, 12617, 126176F(2023).

[19] Harris C, Stephens M. A combined corner and edge detector[C], 147-152(1988).

[20] Ram P, Padmavathi S. Analysis of Harris corner detection for color images[C], 405-410(2016).

[21] Otsu N. A threshold selection method from gray-level histograms[J]. IEEE Transactions on Systems, Man, and Cybernetics, 9, 62-66(1979).

[22] Hong Y, Pang R, Wei Q et al. Nonlinear adaptive enhancement algorithm for uneven illumination images[J]. Laser & Optoelectronics Progress, 60, 1610002(2023).

[23] Sun Y, Xin Z H, Huang P H et al. SAR image sparse denoising based on blind estimation and bilateral filtering[J]. Laser & Optoelectronics Progress, 60, 1610001(2023).

[24] Tomasi C, Manduchi R. Bilateral filtering for gray and color images[C], 839-846(1998).

[25] Horé A, Ziou D. Image quality metrics: PSNR vs. SSIM[C], 2366-2369(2010).