NUCLEAR TECHNIQUES, Volume. 48, Issue 5, 050202(2025)

Impact of source-to-film distance on the accuracy of β-ray surface density measurement

Bing HAN, Jingxin ZUO, Lixin BAI, Yongfei LIANG, and Chaowen YANG*
Author Affiliations
  • School of Physics, Sichuan University, Chengdu 610065, China
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    References(19)

    [6] TIAN Zhao, WANG Ronghui, GAO Feng. Application of β-ray area density online detection technology in lithium battery industry[J]. Power world, 40-42(2017).

    [9] LIU Yisi. β thickness gauge[J]. Nuclear Electronics and Detection Technology, 161-166(1995).

    [10] XU Weirong. Study on on-line measurement method of X-ray thickness gauge for steel rolling[D](2017).

    [14] WU Zhihua[M]. Experimental methods in nuclear physics(1997).

    [19] Agostinelli S, Allison J, Amako K A et al. GEANT4—a simulation toolkit[J]. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 506, 250-303(2003).

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    Bing HAN, Jingxin ZUO, Lixin BAI, Yongfei LIANG, Chaowen YANG. Impact of source-to-film distance on the accuracy of β-ray surface density measurement[J]. NUCLEAR TECHNIQUES, 2025, 48(5): 050202

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    Paper Information

    Category: ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS

    Received: Sep. 23, 2024

    Accepted: --

    Published Online: Jun. 26, 2025

    The Author Email: Chaowen YANG (杨朝文)

    DOI:10.11889/j.0253-3219.2025.hjs.48.240387

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