NUCLEAR TECHNIQUES, Volume. 48, Issue 5, 050202(2025)

Impact of source-to-film distance on the accuracy of β-ray surface density measurement

Bing HAN, Jingxin ZUO, Lixin BAI, Yongfei LIANG, and Chaowen YANG*
Author Affiliations
  • School of Physics, Sichuan University, Chengdu 610065, China
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    Figures & Tables(7)
    Schematic diagram of the β-ray surface density measurement device (a) Detector structure, (b) Measurement device structure
    The measuredln(I/I0) results of Cu films with different SFD (color online)
    Measurement results of Cu film surface density at different SFD (color online) (a) Calculated surface density tp from calibration curve, (b) Relative deviation between tp and the standard surface density tm
    Geant4 simulation results of Cu film surface density at different SFD (color online) (a) Calculated surface density tp from calibration curve, (b) Relative deviation between tp and standard surface density tm
    Three types of collimator geometric models (a) Detector side single collimator, (b) Source side single collimator, (c) Dual collimators between the source and detector
    Mean absolute deviation between the calculated and standard Cu film surface densities under 1 mm SFD variation for three collimator geometries
    Measurement results of Cu film surface density at different SFD after device improvement (color online) (a) Calculated surface density tp from calibration curve, (b) Relative deviation between tp and standard surface density tm
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    Bing HAN, Jingxin ZUO, Lixin BAI, Yongfei LIANG, Chaowen YANG. Impact of source-to-film distance on the accuracy of β-ray surface density measurement[J]. NUCLEAR TECHNIQUES, 2025, 48(5): 050202

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    Paper Information

    Category: ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS

    Received: Sep. 23, 2024

    Accepted: --

    Published Online: Jun. 26, 2025

    The Author Email: Chaowen YANG (杨朝文)

    DOI:10.11889/j.0253-3219.2025.hjs.48.240387

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