Infrared Technology, Volume. 46, Issue 11, 1315(2024)

Defect Detection of Photovoltaic Panel Infrared Image Based on YOLOv7-EPAN

Bing LI1,2, Kuan ZHAO1, Yunshan BAI1, Congbin GUO1, Wei XU1, Dawei XU1,3, and Yongjie ZHAI1、*
Author Affiliations
  • 1Department of automation, North China Electric Power University, Baoding 071003, China
  • 2Baoding Key Laboratory of State Detection and Optimization Control of Integrated Energy System, Baoding 071003, China
  • 3State Key Laboratory of Complex Systems Management and Control, Institute of Automation, Chinese Academy of Sciences, Beijing 100190, China
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    LI Bing, ZHAO Kuan, BAI Yunshan, GUO Congbin, XU Wei, XU Dawei, ZHAI Yongjie. Defect Detection of Photovoltaic Panel Infrared Image Based on YOLOv7-EPAN[J]. Infrared Technology, 2024, 46(11): 1315

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    Paper Information

    Category:

    Received: Jul. 1, 2023

    Accepted: Jan. 10, 2025

    Published Online: Jan. 10, 2025

    The Author Email: Yongjie ZHAI (zhaiyongjie@ncepu.edu.cn)

    DOI:

    CSTR:32186.14.

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