Defect Detection of Photovoltaic Panel Infrared Image Based on YOLOv7-EPAN

Bing LI; Kuan ZHAO; Yunshan BAI; Congbin GUO; Wei XU; Dawei XU; Yongjie ZHAI

Infrared Technology, Volume. 46, Issue 11, 1315(2024)

Bing LI^1,2, Kuan ZHAO¹, Yunshan BAI¹, Congbin GUO¹, Wei XU¹, Dawei XU^1,3, and Yongjie ZHAI^1、*

Author Affiliations

¹Department of automation, North China Electric Power University, Baoding 071003, China

²Baoding Key Laboratory of State Detection and Optimization Control of Integrated Energy System, Baoding 071003, China

³State Key Laboratory of Complex Systems Management and Control, Institute of Automation, Chinese Academy of Sciences, Beijing 100190, China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(0)

Tools

Get Citation

Copy Citation Text

LI Bing, ZHAO Kuan, BAI Yunshan, GUO Congbin, XU Wei, XU Dawei, ZHAI Yongjie. Defect Detection of Photovoltaic Panel Infrared Image Based on YOLOv7-EPAN[J]. Infrared Technology, 2024, 46(11): 1315

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Jul. 1, 2023

Accepted: Jan. 10, 2025

Published Online: Jan. 10, 2025

The Author Email: Yongjie ZHAI (zhaiyongjie@ncepu.edu.cn)

DOI:

CSTR:32186.14.

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology