Laser & Optoelectronics Progress, Volume. 57, Issue 3, 031201(2020)

Defect Detection in Mirror-Like Object Surface Based on Phase Deflection

Shuo Jiang, Linghui Yang, Yongjie Ren, and Jigui Zhu*
Author Affiliations
  • State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China
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    Figures & Tables(14)
    Schematic of mirror surface defect detection based on PMD
    Mirror surface defect detection system based on PMD
    Extraction of wrapped phase Φ(x,y). (a) Sequence image of four-step phase-shift; (b) wrapped phase Φ(x,y)
    Wrapped phase jump error. (a) Wrapped phase Φ(x,y) and corresponding a of jump error in some row; (b) local amplification of wrapped phase jump error
    Correction of wrapped phase jump error. (a) Wrapped phase with and without correction; (b) local amplification of wrapped phase correction effect
    Calculation of period index k(x,y). (a) Sequence image of Gray-code; (b) period index k(x,y)
    Unfolding of wrapped phase. (a) Wrapped phase Φ(x,y); (b) period index k(x,y) of wrapped phase; (c) absolute phase ?(x,y)
    Error in phase unwrapping. (a) Diagram of absolute phase intensity; (b) absolute phase of marked line in Fig. 8(a)
    Correction of period index k(x,y)
    Painted fuselage sample
    Diagram of experimental system
    Defect detection results without and with period index correction. (a)(b) Intensity images of absolute phase; absolute phases of marked line in (c) Fig. 12(a) and (d) Fig. 12(b); defect detection results in (e) Fig. 12(a) and (f) Fig. 12 (b)
    Defect locations and contours. (a) Defect locations and contours on wrapped phase image; (b) local amplification of defects
    Defect locations and contours on painted surface. (a) Hairy fiber; (b) sagging; (c) paint slag;(d) scratch before paint; (e) dirt; (f) dent; (g) craters; (h) bump
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    Shuo Jiang, Linghui Yang, Yongjie Ren, Jigui Zhu. Defect Detection in Mirror-Like Object Surface Based on Phase Deflection[J]. Laser & Optoelectronics Progress, 2020, 57(3): 031201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 3, 2019

    Accepted: Jul. 26, 2019

    Published Online: Feb. 17, 2020

    The Author Email: Jigui Zhu (jiguizhu_tju@163.com)

    DOI:10.3788/LOP57.031201

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