Chinese Journal of Lasers, Volume. 48, Issue 7, 0701008(2021)

Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms

Shanshan Wei1,2, Yuanhuang Liu1,2, Qunfeng Chen3, Bo Yao2, Ji Zhang1,2, Lin Zhou3, and Qinghe Mao1,2、*
Author Affiliations
  • 1School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2Anhui Provincial Key Laboratory of Photonics Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 3Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan, Hubei 430071,China
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    Shanshan Wei, Yuanhuang Liu, Qunfeng Chen, Bo Yao, Ji Zhang, Lin Zhou, Qinghe Mao. Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms[J]. Chinese Journal of Lasers, 2021, 48(7): 0701008

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    Paper Information

    Category: laser devices and laser physics

    Received: Aug. 17, 2020

    Accepted: Sep. 22, 2020

    Published Online: Mar. 25, 2021

    The Author Email: Qinghe Mao (mqinghe@aiofm.ac.cn)

    DOI:10.3788/CJL202148.0701008

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