Chinese Journal of Lasers, Volume. 48, Issue 7, 0701008(2021)

Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms

Shanshan Wei1,2, Yuanhuang Liu1,2, Qunfeng Chen3, Bo Yao2, Ji Zhang1,2, Lin Zhou3, and Qinghe Mao1,2、*
Author Affiliations
  • 1School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2Anhui Provincial Key Laboratory of Photonics Devices and Materials, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 3Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan, Hubei 430071,China
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    Figures & Tables(4)
    Schematic diagram of sideband-locked high-power 780 nm laser system
    Measured saturation absorption spectroscopy and error signal of 85Rb atomic F=3→F'transitions
    Experimental results. (a) Measured error signal amplitude changes with time when seed laser is free-running and frequency doubled 780 nm sideband is locked, respectively; (b) measured optical spectrum for 2.25 W high-power 780 nm laser, inset shows 780 nm laser spectrum measured before PPLN-1
    Experimental results. (a) Measured linewidth of amplified 1560 nm fundamental frequency laser after sideband locking (solid curve is measured value and dash curve is Lorentz fitting value), inset shows measured result when sideband is not locked; (b) recorded center frequency tuning characteristics of amplified 1560 nm fundamental frequency laser during scanning the EOM-1 microwave modulation frequency
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    Shanshan Wei, Yuanhuang Liu, Qunfeng Chen, Bo Yao, Ji Zhang, Lin Zhou, Qinghe Mao. Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms[J]. Chinese Journal of Lasers, 2021, 48(7): 0701008

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    Paper Information

    Category: laser devices and laser physics

    Received: Aug. 17, 2020

    Accepted: Sep. 22, 2020

    Published Online: Mar. 25, 2021

    The Author Email: Mao Qinghe (mqinghe@aiofm.ac.cn)

    DOI:10.3788/CJL202148.0701008

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