Chinese Journal of Lasers, Volume. 48, Issue 7, 0701008(2021)
Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms
Fig. 2. Measured saturation absorption spectroscopy and error signal of 85Rb atomic F=3→F'transitions
Fig. 3. Experimental results. (a) Measured error signal amplitude changes with time when seed laser is free-running and frequency doubled 780 nm sideband is locked, respectively; (b) measured optical spectrum for 2.25 W high-power 780 nm laser, inset shows 780 nm laser spectrum measured before PPLN-1
Fig. 4. Experimental results. (a) Measured linewidth of amplified 1560 nm fundamental frequency laser after sideband locking (solid curve is measured value and dash curve is Lorentz fitting value), inset shows measured result when sideband is not locked; (b) recorded center frequency tuning characteristics of amplified 1560 nm fundamental frequency laser during scanning the EOM-1 microwave modulation frequency
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Shanshan Wei, Yuanhuang Liu, Qunfeng Chen, Bo Yao, Ji Zhang, Lin Zhou, Qinghe Mao. Sideband-Locked High-Power 780 nm Laser Source for Precise Measurement Based on Rb Atoms[J]. Chinese Journal of Lasers, 2021, 48(7): 0701008
Category: laser devices and laser physics
Received: Aug. 17, 2020
Accepted: Sep. 22, 2020
Published Online: Mar. 25, 2021
The Author Email: Mao Qinghe (mqinghe@aiofm.ac.cn)