Journal of Optoelectronics · Laser, Volume. 35, Issue 2, 180(2024)

Research on nondestructive testing method for X-ray image of single thermal battery based on improved VGG network

XU Wenchao1,2、*, ZHANG Sixiang1, BAI Fang2, ZHAO Tao1, and YI Jilu3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(9)

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    XU Wenchao, ZHANG Sixiang, BAI Fang, ZHAO Tao, YI Jilu. Research on nondestructive testing method for X-ray image of single thermal battery based on improved VGG network[J]. Journal of Optoelectronics · Laser, 2024, 35(2): 180

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    Paper Information

    Received: Aug. 24, 2022

    Accepted: --

    Published Online: Sep. 25, 2024

    The Author Email: XU Wenchao (xuwenchao@tjcu.edu.cn)

    DOI:10.16136/j.joel.2024.02.0595

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