Journal of Optoelectronics · Laser, Volume. 35, Issue 2, 180(2024)
Research on nondestructive testing method for X-ray image of single thermal battery based on improved VGG network
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XU Wenchao, ZHANG Sixiang, BAI Fang, ZHAO Tao, YI Jilu. Research on nondestructive testing method for X-ray image of single thermal battery based on improved VGG network[J]. Journal of Optoelectronics · Laser, 2024, 35(2): 180
Paper Information
Received: Aug. 24, 2022
Accepted: --
Published Online: Sep. 25, 2024
The Author Email: XU Wenchao (xuwenchao@tjcu.edu.cn)
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