Laser & Optoelectronics Progress, Volume. 62, Issue 16, 1625001(2025)
Modeling and Analysis of Charge Overflow in Active Pixels Based on LOFIC Technology
Fig. 1. PPD cross-section diagram and potential diagram along cutline B-B'. (a) Simple cross-section of PPD; (b) potential diagram along cutline B-B'
Fig. 2. 2D TCAD electrostatic potential simulation and simplified cross section of the PPD along A1‒A4. (a) VTG=0.2 V; (b) VTG=0.4 V
Fig. 5. Potential of TCAD simulation and model calculation results under different TG voltages. (a) VTG = 0.5 V; (b) VTG = 0.6 V; (c) VTG = 0.7 V
Fig. 6. Comparison between the proposed model results and TCAD simulations for different light intensities. (a) Variation of the PPD potential for different TG voltages; (b) variation of FWC for different TG voltages
Fig. 7. Simulation results of charge accumulation and charge overflow with time under the condition of light luminance intensity of 90 lx and VTG of 0.7 V. (a)(b) Curves of charge accumulation and charge overflow with time at light luminance intensity of 90 lx; (c)(d) curves of charge accumulation and charge overflow with time when VTG is 0.7 V
Fig. 8. Test chip. (a) Photograph of the test chip; (b) LOFIC pixel structure of the test chip; (c) timing diagram of the pixel
Fig. 9. Variation of charge accumulation with light luminance intensity under different TG voltages. (a) Model results; (b) test results
Fig. 10. Test results of total amount of overflow electrons under fixed grid voltage and different light luminance intensities. (a) VTG = 0.4 V; (b) VTG = 0.6 V
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Qiang Zhang, Zhiyuan Gao, Biao Ma, Jing Gao, Jiangtao Xu. Modeling and Analysis of Charge Overflow in Active Pixels Based on LOFIC Technology[J]. Laser & Optoelectronics Progress, 2025, 62(16): 1625001
Category: OPTOELECTRONICS
Received: Mar. 11, 2025
Accepted: Mar. 25, 2025
Published Online: Jul. 30, 2025
The Author Email: Zhiyuan Gao (gaozhiyuan@tju.edu.cn)
CSTR:32186.14.LOP250798