Deep-Ultraviolet Laser-Diode Radiation Recombination Properties Based on Double-Concave Waveguide Layers

Yuan Xu; Shiqin Wei; Pengfei Zhang; Yao Wang; Fang Wang; Yuhuai Liu

doi:10.3788/LOP221705

Laser & Optoelectronics Progress, Volume. 60, Issue 15, 1514007(2023)

Deep-Ultraviolet Laser-Diode Radiation Recombination Properties Based on Double-Concave Waveguide Layers

Yuan Xu¹, Shiqin Wei¹, Pengfei Zhang¹, Yao Wang¹, Fang Wang^1,2、*, and Yuhuai Liu^1,2,3,4、**

¹National Center for International Joint Research of Electronic Materials and Systems, School of Information Engineering, Zhengzhou University, Zhengzhou 450001, Henan, China

²Research Institute of Sensors, Zhengzhou University, Zhengzhou 450001, Henan, China

³Zhengzhou Way Do Electronics Technology Co., Ltd., Zhengzhou 450001, Henan, China

⁴Industrial Technology Research Institute Co., Ltd., Zhengzhou University, Zhengzhou 450001, Henan, China

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Yuan Xu, Shiqin Wei, Pengfei Zhang, Yao Wang, Fang Wang, Yuhuai Liu. Deep-Ultraviolet Laser-Diode Radiation Recombination Properties Based on Double-Concave Waveguide Layers[J]. Laser & Optoelectronics Progress, 2023, 60(15): 1514007

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Paper Information

Category: Lasers and Laser Optics

Received: May. 26, 2022

Accepted: Jul. 26, 2022

Published Online: Aug. 11, 2023

The Author Email: Fang Wang (iefwang@zzu.edu.cn), Yuhuai Liu (ieyhliu@zzu.edu.cn)

DOI:10.3788/LOP221705

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology