Laser Technology, Volume. 48, Issue 6, 906(2024)

Measurement method for surface topography based on quadriwave lateral shearing interferometry

DONG Zhengqiong1, HUANG Xianwen1, XU Ren1, ZHU Renlong1, ZHOU Xiangdong1, and NIE Lei1,2、*
Author Affiliations
  • 1Key Laboratory of Modern Manufacture Quality Engineering, School of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, China
  • 2Xiangyang Industrial Institute of Hubei University of Technonogy, Xiangyang 441100, China
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    References(12)

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    DONG Zhengqiong, HUANG Xianwen, XU Ren, ZHU Renlong, ZHOU Xiangdong, NIE Lei. Measurement method for surface topography based on quadriwave lateral shearing interferometry[J]. Laser Technology, 2024, 48(6): 906

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    Paper Information

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    Received: Sep. 11, 2023

    Accepted: Feb. 13, 2025

    Published Online: Feb. 13, 2025

    The Author Email: NIE Lei (leinie@hbut.edu.cn)

    DOI:10.7510/jgjs.issn.1001-3806.2024.06.017

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