Photonics Research, Volume. 4, Issue 3, 0115(2016)
Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector
Fig. 1. Spectral reflectance reconstruction principle based on the sparse prior by a single-pixel detector.
Fig. 2. Principal component of training sample set of 1296 Munsell colors.
Fig. 3. Relative spectral power distribution of modulated illuminating light based on the principal component of training sample set of 1296 Munsell color. (a) Relative spectral power distribution of modulating light based on the first principal component. (b) Relative spectral power distribution of modulating light based on the second principal component. (c) Relative spectral power distribution of modulating light based on the third principal component.
Fig. 4. Spectral reflectance of a piece of training sample set of 1296 Munsell color.
Fig. 5. Results of spectral reflectance reconstruction based on the sparse prior by a single-pixel detector.
Fig. 6. Effect of the number of base vectors of principal component orthogonal basis.
Fig. 7. Chromaticity spatial distribution of training sample sets (a) X-Rite 24, (b) X-Rite 140, (c) Pantone, and (d) Munsell.
Fig. 8. Reconstruction error of selecting different training samples.
Fig. 10. Experimental results of spectral reflectance reconstruction based on sparse prior by a single detector.
Fig. 11. Effect of the number of the principal component base vector.
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Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma, "Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector," Photonics Res. 4, 0115 (2016)
Special Issue: TERAHERTZ PHOTONICS: APPLICATIONS AND TECHNIQUES
Received: Jan. 12, 2016
Accepted: Feb. 11, 2016
Published Online: Sep. 29, 2016
The Author Email: Dawei Zhang (usstoe@vip.163.com)