Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector

Leihong Zhang; Dong Liang; Bei Li; Yi Kang; Zilan Pan; Dawei Zhang; Xiuhua Ma

doi:10.1364/prj.4.000115

Photonics Research, Volume. 4, Issue 3, 0115(2016)

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector

Leihong Zhang¹, Dong Liang¹, Bei Li¹, Yi Kang¹, Zilan Pan¹, Dawei Zhang^2、*, and Xiuhua Ma³

Author Affiliations

¹College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China

²School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

³Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China

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Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma, "Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector," Photonics Res. 4, 0115 (2016)

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Paper Information

Special Issue: TERAHERTZ PHOTONICS: APPLICATIONS AND TECHNIQUES

Received: Jan. 12, 2016

Accepted: Feb. 11, 2016

Published Online: Sep. 29, 2016

The Author Email: Dawei Zhang (usstoe@vip.163.com)

DOI:10.1364/prj.4.000115

Topics

laser devices and laser physics

Lasers and Laser Optics

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