Acta Optica Sinica, Volume. 37, Issue 10, 1012006(2017)

Design and Control of Ultra-Precision Fine Positioning Stage for Scanning Beam Interference Lithography

Sen Lu1,2, Kaiming Yang1,2、*, Yu Zhu1,2, Leijie Wang1,2, Ming Zhang1,2, and Jin Yang3
Author Affiliations
  • 1 State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
  • 2 Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing 100084, China
  • 3 Basic Technology Research Department, Dongfeng Commercial Vehicle Technical Center, Wuhan, Hubei 430056, China
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    Figures & Tables(14)
    SBIL system
    Scanning and step exposure process of SBIL
    Fringe phase-locking control principle
    Schematic diagram of the Fourier transform of D1(x)
    Exposure contrast versus period measurement error
    Schematic diagram of coarse-fine dual stage structure
    Block diagram of coarse-fine dual stage docking scheme
    Internal structure diagram of fine positioning stage
    System overview of fine positioning stage
    Three degree of freedom decoupling control block diagram of fine positioning stage
    Identified and fitted results of x degree of freedom model
    Bode diagram of open loop transfer function
    Positioning errors in degrees of freedom of x,y,θz with close-loop control
    • Table 1. Statistics of positioning error in x,y,θz

      View table

      Table 1. Statistics of positioning error in x,y,θz

      Motion directionPositioning error
      RMSPeak-peak
      x /nm1.5111.28
      y /nm5.4638.19
      θz /μrad0.020.17
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    Sen Lu, Kaiming Yang, Yu Zhu, Leijie Wang, Ming Zhang, Jin Yang. Design and Control of Ultra-Precision Fine Positioning Stage for Scanning Beam Interference Lithography[J]. Acta Optica Sinica, 2017, 37(10): 1012006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 5, 2017

    Accepted: --

    Published Online: Sep. 7, 2018

    The Author Email: Kaiming Yang (yangkm@tsinghua.edu.cn)

    DOI:10.3788/AOS201737.1012006

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