Acta Optica Sinica, Volume. 37, Issue 10, 1012006(2017)

Design and Control of Ultra-Precision Fine Positioning Stage for Scanning Beam Interference Lithography

Sen Lu1,2, Kaiming Yang1,2、*, Yu Zhu1,2, Leijie Wang1,2, Ming Zhang1,2, and Jin Yang3
Author Affiliations
  • 1 State Key Laboratory of Tribology, Department of Mechanical Engineering, Tsinghua University, Beijing 100084, China
  • 2 Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control, Tsinghua University, Beijing 100084, China
  • 3 Basic Technology Research Department, Dongfeng Commercial Vehicle Technical Center, Wuhan, Hubei 430056, China
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    Sen Lu, Kaiming Yang, Yu Zhu, Leijie Wang, Ming Zhang, Jin Yang. Design and Control of Ultra-Precision Fine Positioning Stage for Scanning Beam Interference Lithography[J]. Acta Optica Sinica, 2017, 37(10): 1012006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 5, 2017

    Accepted: --

    Published Online: Sep. 7, 2018

    The Author Email: Kaiming Yang (yangkm@tsinghua.edu.cn)

    DOI:10.3788/AOS201737.1012006

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