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Laser & Optoelectronics Progress, Volume. 56, Issue 12, 121201(2019)

Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination

Jingyou Liu1,2、* and Feng Lei1,2
Author Affiliations
  • 1 School of Physics and Electronic Electrical Engineering, Huaiyin Normal University, Huai'an, Jiangsu 223300, China
  • 2 Key Laboratory of Huai'an's Micro-Nano Optical Imaging, Huai'an, Jiangsu 223300, China
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    Jingyou Liu, Feng Lei. Measurement of Lens-Center Thickness Based on Low-Coherence Interference with Transmitted Illumination[J]. Laser & Optoelectronics Progress, 2019, 56(12): 121201

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 6, 2018

    Accepted: Jan. 15, 2019

    Published Online: Jun. 13, 2019

    The Author Email: Jingyou Liu (jyliujs@163.com)

    DOI:10.3788/LOP56.121201

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology