Acta Optica Sinica, Volume. 37, Issue 11, 1112004(2017)
High Quality Fringe Patterns Captured from Phase Measuring Deflectometry
Fig. 3. Simulation result for the influence of dynamic range of fringe intensity on phase accuracy
Fig. 5. Simulation results of direct relations between nonlinearity and RFFA/RFDA. (a) RFFA/RFDA=12.24 ; (b) RFFA/RFDA=4.23
Fig. 7. Relationships between system parameters and contrast ratio of fringe pattern obtained by simulation. (a) Relationships between F value or fringe pattern period and contrast ratio of fringe pattern when b is 0.40; (b) relationships between fringe pattern period or modulation and contrast ratio of fringe patter when F value is fixed at certain value
Fig. 8. Relationships between system parameters and sinuousness of fringe pattern obtained by simulation. (a) Relationships between F value or fringe pattern period and sinuousness of fringe pattern when b is 0.40; (b) relationships between fringe pattern period or modulation and sinuousness of fringe pattern when F value is 11.0
Fig. 10. Fringe patterns captured by CCD camera in PMD system under different conditions. (a) b=0.40, F=5.6, T=20 pixel; (b) b=0.40, F=8.0, T=20 pixel; (c) b=0.40, F=8.0, T=80 pixel; (d) b=0.05, F=5.6, T=30 pixel; (e) b=0.45, F=5.6, T=30 pixel; (f) b=0.45, F=5.6, T=80 pixel
Fig. 11. Relationships between system parameters and contrast ratio of fringe pattern in PMD system. (a) Relationships between F value or fringe pattern period and contrast ratio of fringe pattern when b is 0.40; (b) relationships between fringe pattern period or modulation and contrast ratio of fringe pattern when F value is 5.6
Fig. 12. Relationships between system parameters and sinuousness of fringe pattern in PMD system. (a) Relationships between F value or fringe pattern period and sinuousness of fringe pattern when b is 0.40; (b) relationships between fringe pattern period or modulation and sinuousness of fringe pattern when F value is 5.6
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Huimin Yue, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, Yong Liu. High Quality Fringe Patterns Captured from Phase Measuring Deflectometry[J]. Acta Optica Sinica, 2017, 37(11): 1112004
Category: Instrumentation, Measurement and Metrology
Received: Jun. 14, 2017
Accepted: --
Published Online: Sep. 7, 2018
The Author Email: Yue Huimin (yuehuimin@uestc.edu.cn)