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Acta Optica Sinica, Volume. 37, Issue 11, 1112004(2017)

High Quality Fringe Patterns Captured from Phase Measuring Deflectometry

Huimin Yue*, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, and Yong Liu
Author Affiliations
  • College of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
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    Article index updated: Mar. 10, 2025

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    Huimin Yue, Rong Li, Zhipeng Pan, Hongli Chen, Yuxiang Wu, Yong Liu. High Quality Fringe Patterns Captured from Phase Measuring Deflectometry[J]. Acta Optica Sinica, 2017, 37(11): 1112004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jun. 14, 2017

    Accepted: --

    Published Online: Sep. 7, 2018

    The Author Email: Yue Huimin (yuehuimin@uestc.edu.cn)

    DOI:10.3788/AOS201737.1112004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology