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Chinese Optics Letters, Volume. 16, Issue 11, 111801(2018)

Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging

Suhui Deng1,2, Yiping Xiao1, Jie Hu1, Jianfang Chen3, Yuhao Wang1, and Mingping Liu1、*
Author Affiliations
  • 1School of Information Engineering, Nanchang University, Nanchang 330031, China
  • 2Division of Physical Biology, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
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    Schematic diagram of the optical system of a subtractive Bessel LSFM.

    Fig. 1. Schematic diagram of the optical system of a subtractive Bessel LSFM.

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    Calculated intensity distributions of (a), (c) the extended Bessel light-sheet beam and (b), (d) the ring-like Bessel light-sheet beam (a), (b) in the y–z plane with x=0 and (c), (d) in the x–z plane with y=0 . (e) The normalized line profiles of the intensity distributions along the central z axis in (c) and (d).

    Fig. 2. Calculated intensity distributions of (a), (c) the extended Bessel light-sheet beam and (b), (d) the ring-like Bessel light-sheet beam (a), (b) in the y–z plane with x=0 and (c), (d) in the x–z plane with y=0 . (e) The normalized line profiles of the intensity distributions along the central z axis in (c) and (d).

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    PSFs of the light-sheet microscopy in the y–z plane. (a) The calculated illumination PSF for the conventional Bessel LSFM with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (b) The detection PSF with NAdet=0.7. (c) The system PSF for the conventional Bessel LSFM. (d) The system PSF for subtractive Bessel LSFM obtained with extended solid Bessel beam with an annular mask characterized by NAmax=0.67 and NAmin=0.65 and a ring-like Bessel beam with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (e) The normalized line profiles of the intensity distributions along the central axis in (c) and (d).

    Fig. 3. PSFs of the light-sheet microscopy in the y–z plane. (a) The calculated illumination PSF for the conventional Bessel LSFM with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (b) The detection PSF with NAdet=0.7. (c) The system PSF for the conventional Bessel LSFM. (d) The system PSF for subtractive Bessel LSFM obtained with extended solid Bessel beam with an annular mask characterized by NAmax=0.67 and NAmin=0.65 and a ring-like Bessel beam with an annular mask characterized by NAmax=0.7 and NAmin=0.68. (e) The normalized line profiles of the intensity distributions along the central axis in (c) and (d).

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    Simulated images of a sample consisting of 16 points shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM.

    Fig. 4. Simulated images of a sample consisting of 16 points shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM.

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    Simulated images of a sample consisting of four parallel lines shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM. (d) The central line profiles of the intensity along the z axis in (a), (b), and (c).

    Fig. 5. Simulated images of a sample consisting of four parallel lines shown in (a) for (b) the conventional Bessel LSFM and (c) the subtractive Bessel LSFM. (d) The central line profiles of the intensity along the z axis in (a), (b), and (c).

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    Suhui Deng, Yiping Xiao, Jie Hu, Jianfang Chen, Yuhao Wang, Mingping Liu, "Sidelobe suppression in light-sheet fluorescence microscopy with Bessel beam plane illumination using subtractive imaging," Chin. Opt. Lett. 16, 111801 (2018)

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    Paper Information

    Category: Microscopy

    Received: Jul. 26, 2018

    Accepted: Sep. 29, 2018

    Published Online: Nov. 11, 2018

    The Author Email: Mingping Liu (mpliu@ncu.edu.cn)

    DOI:10.3788/COL201816.111801

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology