Chinese Journal of Lasers, Volume. 51, Issue 2, 0210001(2024)
Simulation of Charge Collection Efficiency Optimization for EBCMOS with Uniform and Gradient Doping
Fig. 5. Scatter diagram of electronics in pixel area for different substrate thicknesses. (a) 5 μm; (b) 15 μm; (c) 25 μm; (d) 35 μm
Fig. 7. Scatter diagram of electronics in pixel area for different proximity distances. (a) 5000 μm; (b) 3000 μm; (c) 1000 μm; (d) 500 μm
Get Citation
Copy Citation Text
Gangcheng Jiao, De Song, Lei Yan, Chao Xiao, Ye Li, Weijun Chen. Simulation of Charge Collection Efficiency Optimization for EBCMOS with Uniform and Gradient Doping[J]. Chinese Journal of Lasers, 2024, 51(2): 0210001
Category: remote sensing and sensor
Received: May. 4, 2023
Accepted: May. 22, 2023
Published Online: Jan. 4, 2024
The Author Email: Song De (songde614@163.com), Chen Weijun (chenweijun@cust.edu.cn)
CSTR:32183.14.CJL230794