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Photonics Research, Volume. 7, Issue 9, 1019(2019)

Common-anode LED on a Si substrate for beyond 15 Gbit/s underwater visible light communication Editors' Pick

Yingjun Zhou1, Xin Zhu2, Fangchen Hu1, Jianyang Shi1, Fumin Wang1, Peng Zou1, Junlin Liu2, Fengyi Jiang2, and Nan Chi1、*
Author Affiliations
  • 1Department of Communication Science and Engineering, Key Laboratory for Information Science of Electromagnetic Waves (MoE), Fudan University, Shanghai 200433, China
  • 2National Institute of LED on Silicon Substrate, Nanchang University, Nanchang 330096, China
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    CLP Journals

    [1] Chaofan Wang, Guoqiang Li, Fangchen Hu, Yiheng Zhao, Junlian Jia, Peng Zou, Qiuyi Lu, Jiang Chen, Zhongya Li, Nan Chi, "Visible light communication for Vehicle to Everything beyond 1 Gb/s based on an LED car headlight and a 2 × 2 PIN array," Chin. Opt. Lett. 18, 110602 (2020)

    [2] Fangchen Hu, Shouqing Chen, Guoqiang Li, Peng Zou, Junwen Zhang, Jian Hu, Jianli Zhang, Zhixue He, Shaohua Yu, Fengyi Jiang, Nan Chi, "Si-substrate LEDs with multiple superlattice interlayers for beyond 24 Gbps visible light communication," Photonics Res. 9, 1581 (2021)

    [3] Chao Fei, Xiaojian Hong, Ji Du, Guowu Zhang, Yuan Wang, Xiaoman Shen, Yuefeng Lu, Yang Guo, Sailing He, "High-speed underwater wireless optical communications: from a perspective of advanced modulation formats [Invited]," Chin. Opt. Lett. 17, 100012 (2019)

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    Yingjun Zhou, Xin Zhu, Fangchen Hu, Jianyang Shi, Fumin Wang, Peng Zou, Junlin Liu, Fengyi Jiang, Nan Chi, "Common-anode LED on a Si substrate for beyond 15 Gbit/s underwater visible light communication," Photonics Res. 7, 1019 (2019)

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    Paper Information

    Category: Fiber Optics and Optical Communications

    Received: Feb. 15, 2019

    Accepted: Jul. 3, 2019

    Published Online: Aug. 12, 2019

    The Author Email: Nan Chi (nanchi@fudan.edu.cn)

    DOI:10.1364/PRJ.7.001019

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology