Chinese Optics Letters, Volume. 21, Issue 10, 101201(2023)

Nanometer-scale displacement measurement based on an orthogonal dual Michelson interferometer

Ju Wang, Ziheng Cai, Jinlong Yu*, Hao Luo, and Chuang Ma
Author Affiliations
  • School of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China
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    Figures & Tables(6)
    Experimental setup for the orthogonal dual interferometer.
    (a) Two quadrature signals generated; (b) Lissajous graph.
    (a) Interference signal received by PD1; (b) interference signal received by PD2; (c) interference signal variation diagram when the displacement direction is changed; (d) Lissajous figure when moving along the x direction; (e) Lissajous figure when moving along the −x direction.
    (a) Conventional interferometer single-channel data acquisition; (b) phase difference resulting from each displacement; (c) orthogonal dual-interferometer two-way data acquisition; (d) 20 nm step displacement measurement results; (e) 10 nm step displacement measurement results; (f) 5 nm step displacement measurement results.
    (a) Schematic diagram of cosine error; (b) two interference signals when the target is stationary.
    • Table 1. Orthogonal Dual-Interferometer Limit Resolution Error Results

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      Table 1. Orthogonal Dual-Interferometer Limit Resolution Error Results

      Step/nmNumberAverage Error/nm
      20360.29
      10360.27
      5360.12
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    Ju Wang, Ziheng Cai, Jinlong Yu, Hao Luo, Chuang Ma, "Nanometer-scale displacement measurement based on an orthogonal dual Michelson interferometer," Chin. Opt. Lett. 21, 101201 (2023)

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    Paper Information

    Category: Instrumentation, Measurement, and Optical Sensing

    Received: Mar. 10, 2023

    Accepted: May. 11, 2023

    Posted: May. 12, 2023

    Published Online: Aug. 28, 2023

    The Author Email: Jinlong Yu (yujinlong@tju.edu.cn)

    DOI:10.3788/COL202321.101201

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