Chinese Optics Letters, Volume. 21, Issue 10, 101201(2023)
Nanometer-scale displacement measurement based on an orthogonal dual Michelson interferometer
Fig. 1. Experimental setup for the orthogonal dual interferometer.
Fig. 2. (a) Two quadrature signals generated; (b) Lissajous graph.
Fig. 3. (a) Interference signal received by PD1; (b) interference signal received by PD2; (c) interference signal variation diagram when the displacement direction is changed; (d) Lissajous figure when moving along the x direction; (e) Lissajous figure when moving along the −x direction.
Fig. 4. (a) Conventional interferometer single-channel data acquisition; (b) phase difference resulting from each displacement; (c) orthogonal dual-interferometer two-way data acquisition; (d) 20 nm step displacement measurement results; (e) 10 nm step displacement measurement results; (f) 5 nm step displacement measurement results.
Fig. 5. (a) Schematic diagram of cosine error; (b) two interference signals when the target is stationary.
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Ju Wang, Ziheng Cai, Jinlong Yu, Hao Luo, Chuang Ma, "Nanometer-scale displacement measurement based on an orthogonal dual Michelson interferometer," Chin. Opt. Lett. 21, 101201 (2023)
Category: Instrumentation, Measurement, and Optical Sensing
Received: Mar. 10, 2023
Accepted: May. 11, 2023
Posted: May. 12, 2023
Published Online: Aug. 28, 2023
The Author Email: Jinlong Yu (yujinlong@tju.edu.cn)