Opto-Electronic Engineering, Volume. 39, Issue 12, 77(2012)

Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space

LI Wei1,2,3、*, SHI Ze-lin1,2, and YIN Jian4
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4[in Chinese]
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    References(17)

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    LI Wei, SHI Ze-lin, YIN Jian. Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space[J]. Opto-Electronic Engineering, 2012, 39(12): 77

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    Paper Information

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    Received: Jul. 16, 2012

    Accepted: --

    Published Online: Dec. 14, 2012

    The Author Email: Wei LI (liwei@sia.cn)

    DOI:10.3969/j.issn.1003-501x.2012.12.013

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