Opto-Electronic Engineering, Volume. 39, Issue 12, 77(2012)
Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space
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LI Wei, SHI Ze-lin, YIN Jian. Detecting Fully Affine Invariant Features in Affine Gaussian Scale-space[J]. Opto-Electronic Engineering, 2012, 39(12): 77
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Received: Jul. 16, 2012
Accepted: --
Published Online: Dec. 14, 2012
The Author Email: Wei LI (liwei@sia.cn)
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