Spectroscopy and Spectral Analysis, Volume. 30, Issue 3, 702(2010)

The Study of Nondestructive Defect Characterization of SiC by

MIAO Rui-xia*, ZHANG Yu-ming, TANG Xiao-yan, and ZHANG Yi-men
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    MIAO Rui-xia, ZHANG Yu-ming, TANG Xiao-yan, ZHANG Yi-men. The Study of Nondestructive Defect Characterization of SiC by[J]. Spectroscopy and Spectral Analysis, 2010, 30(3): 702

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    Paper Information

    Received: Mar. 28, 2009

    Accepted: --

    Published Online: Jul. 23, 2010

    The Author Email: Rui-xia MIAO (miao9508301@163.com)

    DOI:

    CSTR:32186.14.

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